Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads.
Ye, Kai 1,2,*; Schulz, Marcel H. 1,3; Long, Quan 4; Apweiler, Rolf 1; Ning, Zemin 4,*
[Article] Bioinformatics. 25(21):2865-2871, November 1, 2009.

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Motivation: There is a strong demand in the genomic community to develop effective algorithms to reliably identify genomic variants. Indel detection using next-gen data is difficult and identification of long structural variations is extremely challenging.

Results: We present Pindel, a pattern growth approach, to detect breakpoints of large deletions and medium-sized insertions from paired-end short reads. We use both simulated reads and real data to demonstrate the efficiency of the computer program and accuracy of the results.

(C) Copyright Oxford University Press 2009.